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Dallas Chapter |
March 21st, 2006 Mr. John Osburn
Technical Lead for JSF, Electromagnetic Environmental Effects Ft. Worth, Texas
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Minutes to be posted soon.
Program Summary - This presentation is intended to review basic immunity system design, identify serious issues in system design, and suggest possible corrections for these problems. The purpose of immunity testing is to determine if the equipment under test (EUT) responds to incident electromagnetic radiation at a specific level. Failure to respond to specified electromagnetic levels "assures" continued proper operation of the EUT in a hostile electromagnetic ambient environment. Standard conditions of testing and test equipment performance are required to allow inter-comparison of test results between labs and over time. Technical Issues such as signal generator and power amplifier non-ideal performance and test signal generation antenna performance characteristics will be discussed, specifically significant harmonics of the fundamental, transient behavior on switching in amplitude and/or frequency and inadequate resolution for precision control during calibration. Recommendations will be presented for proper test instrumentation setup.
Our Speaker: Mr. John Osburn is the Analysis Technical Lead for JSF, Lockheed Martin Aeronautics - Marietta, Ft. Worth, Texas. He received his BSEE from the University of Texas in 1964 and an MS in Systems Management from the University of Southern California in 1985. He is a NARTE Certified EMC Engineer and a former Certified TEMPEST Tester. He has forty-two years of direct experience in EMC/TEMPEST system design, analysis, modeling and testing, including consideration of very large systems. He was appointed Technical lead for JSF Air vehicle in January and Analysis Lead in 2004. He was technical mentor and supervisor (budgets, assignments and proposals) of airlift EEE Engineers located at LM-Aero Marietta through 2001. He provided direct support to Flight Test as flight qualified EEE engineer for C-130J, provided EEE technical support to the various LM-Aero Marietta Programs and was lead EEE engineer for all C-130 Programs. He provided technical support to other Lockheed Martin Aeronautics sites for flight-testing and analysis methods. As an EMC Test Systems Principal EMC Scientist, he provided technical training for all customers on company systems and facilities, technical liaison to standards committees, planned and conducted new technology research, technical lead for definition, introduction and acceptance in international standards of new products. He is a supervisory design engineer for construction of leading edge EMC test facilities He was a First Lieutenant United States Army Reserve and Army Security Agency specialist engineer at the United States Navy Security Group, Washington, DC. He received the Joint Services Commendation Medal while on active Duty for engineering excellence. He holds three measurement instrumentation patents and a widely recognized technical author on topics in electromagnetic compatibility technology, author of more than 100 technical papers, contributor to five technical reference books on EMC engineering, and an internationally recognized EMC lecturer. He is an IEEE Fellow and Life Member of the IEEE -- elected IEEE Fellow for leadership in electromagnetic compatibility (EMC) test technology. He is a past Member and/or Secretary for many US EMC Standards development committees. |
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