Dallas Chapter

April 8th, 2003

Dr. Keith Hardin, 

Lexmark International

EMC-Society Distinguished Lecturer 

"Radiated & Conducted Emission Debug Techniques"

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Dr. Hardin, Senior Technical Staff Member and Technical Team Leader in the EMC Department of Lexmark International in Lexington, Kentucky, discussed the various aspects of spectral and time domain measurements to "reverse engineer" sources of emissions for ITE equipment. Combined use of spectrum analyzers and oscilloscopes with far field measurements and near field probing can be used to characterize the source and develop a solution path to the conducted or radiated emission problem.   He stated that attention should be given to a relatively large range of the spectrum when probing, based on the spectrum noted in far field measurement data (i.e., not just a single frequency), to define a spectrum signature which can be mapped to these near field characteristics to locate the most likely circuits causing the problem. Most of the techniques he discussed can be used to analyze both radiated and conducted emission problems.  He offered several suggestions for signal identification to aid in the location of offending circuits.  

Dr. Hardin also described the role of the Lexmark EMC staff in supporting Lexmark design teams and scheduling lab usage to provide effective and efficient use of the EMC resources at Lexmark.  This would be an excellent model for any EMC support organization.

Handouts of his presentation were given to attendees at the meeting.

The meeting was held at Abbott Labs, Irving TX.  Abbott Labs provided a Mexican buffet and soft drinks prior to the meeting.  Refreshments and the arrangements for the meeting were made by Ms. Kim Cortez, Abbott Labs.  There were 21 attendees at the April meeting, 11 IEEE members and 10 non-IEEE members, including 3 new attendees.